Comments by "Scott Franco" (@scottfranco1962) on "The Difficult Birth of the Scanning Electron Microscope" video.

  1. ....and that was only the beginning. Now electron microscopes can be used instead of mask lithography, and allow the creation of ICs beyond the current reach of technology, giving researches the ability to see what lies at the next shrink level. There is a variation of the SEM that allows reading the voltage on a trace in a live IC with the passivation removed, giving a scope style trace of what is going on there. This is hooked up to the layout database allowing the user to select a wire in the design to display. And FIB or focused ion beams came from the same science, allowing companies to cut out and add material to ICs... literally editing an existing design. The possibilities are endless.
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